Time domain switching/demultiplexing using four wave mixing in GaInP photonic crystal waveguides.
Identifieur interne : 001074 ( Main/Exploration ); précédent : 001073; suivant : 001075Time domain switching/demultiplexing using four wave mixing in GaInP photonic crystal waveguides.
Auteurs : RBID : pubmed:21451632English descriptors
- KwdEn :
- Crystallization, Equipment Design, Equipment Failure Analysis, Gallium (chemistry), Indium (chemistry), Materials Testing, Phosphines (chemistry), Refractometry (instrumentation), Signal Processing, Computer-Assisted (instrumentation), Surface Plasmon Resonance (instrumentation), Telecommunications (instrumentation).
- MESH :
- chemical , chemistry : Gallium, Indium, Phosphines.
- instrumentation : Refractometry, Signal Processing, Computer-Assisted, Surface Plasmon Resonance, Telecommunications.
- Crystallization, Equipment Design, Equipment Failure Analysis, Materials Testing.
Abstract
We describe dynamical four wave mixing (FWM) functionalities of an GaInP photonic crystal waveguide. A W1 waveguide was used to wavelength convert 100 ps pulses and for sampling a 10.56 Gbit/s data stream so as to time demultiplex it into 16 or 32 channels. In all cases, the extracted pulses at the idler wavelength are undistorted and have a high signal to noise ratio proving the high efficiency and the versatility of the FWM process in the GaInP PhC waveguides we used.
PubMed: 21451632
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<record><TEI><teiHeader><fileDesc><titleStmt><title xml:lang="en">Time domain switching/demultiplexing using four wave mixing in GaInP photonic crystal waveguides.</title><author><name sortKey="Cestier, I" uniqKey="Cestier I">I Cestier</name><affiliation wicri:level="1"><nlm:affiliation>Electrical Engineering Department, Technion, Haifa, Israel. cestier@tx.technion.ac.il</nlm:affiliation><country xml:lang="fr">Israël</country><wicri:regionArea>Electrical Engineering Department, Technion, Haifa</wicri:regionArea></affiliation></author><author><name sortKey="Willinger, A" uniqKey="Willinger A">A Willinger</name></author><author><name sortKey="Eckhouse, V" uniqKey="Eckhouse V">V Eckhouse</name></author><author><name sortKey="Eisenstein, G" uniqKey="Eisenstein G">G Eisenstein</name></author><author><name sortKey="Combrie, S" uniqKey="Combrie S">S Combrié</name></author><author><name sortKey="Colman, P" uniqKey="Colman P">P Colman</name></author><author><name sortKey="Lehoucq, G" uniqKey="Lehoucq G">G Lehoucq</name></author><author><name sortKey="De Rossi, A" uniqKey="De Rossi A">A De Rossi</name></author></titleStmt><publicationStmt><date when="2011">2011</date><idno type="RBID">pubmed:21451632</idno><idno type="pmid">21451632</idno><idno type="wicri:Area/Main/Corpus">001464</idno><idno type="wicri:Area/Main/Curation">001464</idno><idno type="wicri:Area/Main/Exploration">001074</idno></publicationStmt></fileDesc><profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Crystallization</term><term>Equipment Design</term><term>Equipment Failure Analysis</term><term>Gallium (chemistry)</term><term>Indium (chemistry)</term><term>Materials Testing</term><term>Phosphines (chemistry)</term><term>Refractometry (instrumentation)</term><term>Signal Processing, Computer-Assisted (instrumentation)</term><term>Surface Plasmon Resonance (instrumentation)</term><term>Telecommunications (instrumentation)</term></keywords><keywords scheme="MESH" type="chemical" qualifier="chemistry" xml:lang="en"><term>Gallium</term><term>Indium</term><term>Phosphines</term></keywords><keywords scheme="MESH" qualifier="instrumentation" xml:lang="en"><term>Refractometry</term><term>Signal Processing, Computer-Assisted</term><term>Surface Plasmon Resonance</term><term>Telecommunications</term></keywords><keywords scheme="MESH" xml:lang="en"><term>Crystallization</term><term>Equipment Design</term><term>Equipment Failure Analysis</term><term>Materials Testing</term></keywords></textClass></profileDesc></teiHeader><front><div type="abstract" xml:lang="en">We describe dynamical four wave mixing (FWM) functionalities of an GaInP photonic crystal waveguide. A W1 waveguide was used to wavelength convert 100 ps pulses and for sampling a 10.56 Gbit/s data stream so as to time demultiplex it into 16 or 32 channels. In all cases, the extracted pulses at the idler wavelength are undistorted and have a high signal to noise ratio proving the high efficiency and the versatility of the FWM process in the GaInP PhC waveguides we used.</div></front></TEI><pubmed><MedlineCitation Owner="NLM" Status="MEDLINE"><PMID Version="1">21451632</PMID><DateCreated><Year>2011</Year><Month>03</Month><Day>31</Day></DateCreated><DateCompleted><Year>2011</Year><Month>08</Month><Day>04</Day></DateCompleted><DateRevised><Year>2013</Year><Month>11</Month><Day>21</Day></DateRevised><Article PubModel="Print"><Journal><ISSN IssnType="Electronic">1094-4087</ISSN><JournalIssue CitedMedium="Internet"><Volume>19</Volume><Issue>7</Issue><PubDate><Year>2011</Year><Month>Mar</Month><Day>28</Day></PubDate></JournalIssue><Title>Optics express</Title><ISOAbbreviation>Opt Express</ISOAbbreviation></Journal><ArticleTitle>Time domain switching/demultiplexing using four wave mixing in GaInP photonic crystal waveguides.</ArticleTitle><Pagination><MedlinePgn>6093-9</MedlinePgn></Pagination><ELocationID EIdType="doi" ValidYN="Y">10.1364/OE.19.006093</ELocationID><Abstract><AbstractText>We describe dynamical four wave mixing (FWM) functionalities of an GaInP photonic crystal waveguide. A W1 waveguide was used to wavelength convert 100 ps pulses and for sampling a 10.56 Gbit/s data stream so as to time demultiplex it into 16 or 32 channels. In all cases, the extracted pulses at the idler wavelength are undistorted and have a high signal to noise ratio proving the high efficiency and the versatility of the FWM process in the GaInP PhC waveguides we used.</AbstractText></Abstract><AuthorList CompleteYN="Y"><Author ValidYN="Y"><LastName>Cestier</LastName><ForeName>I</ForeName><Initials>I</Initials><Affiliation>Electrical Engineering Department, Technion, Haifa, Israel. cestier@tx.technion.ac.il</Affiliation></Author><Author ValidYN="Y"><LastName>Willinger</LastName><ForeName>A</ForeName><Initials>A</Initials></Author><Author ValidYN="Y"><LastName>Eckhouse</LastName><ForeName>V</ForeName><Initials>V</Initials></Author><Author ValidYN="Y"><LastName>Eisenstein</LastName><ForeName>G</ForeName><Initials>G</Initials></Author><Author ValidYN="Y"><LastName>Combrié</LastName><ForeName>S</ForeName><Initials>S</Initials></Author><Author ValidYN="Y"><LastName>Colman</LastName><ForeName>P</ForeName><Initials>P</Initials></Author><Author ValidYN="Y"><LastName>Lehoucq</LastName><ForeName>G</ForeName><Initials>G</Initials></Author><Author ValidYN="Y"><LastName>De Rossi</LastName><ForeName>A</ForeName><Initials>A</Initials></Author></AuthorList><Language>eng</Language><PublicationTypeList><PublicationType>Journal Article</PublicationType><PublicationType>Research Support, Non-U.S. Gov't</PublicationType></PublicationTypeList></Article><MedlineJournalInfo><Country>United States</Country><MedlineTA>Opt Express</MedlineTA><NlmUniqueID>101137103</NlmUniqueID><ISSNLinking>1094-4087</ISSNLinking></MedlineJournalInfo><ChemicalList><Chemical><RegistryNumber>0</RegistryNumber><NameOfSubstance>Phosphines</NameOfSubstance></Chemical><Chemical><RegistryNumber>045A6V3VFX</RegistryNumber><NameOfSubstance>Indium</NameOfSubstance></Chemical><Chemical><RegistryNumber>12063-98-8</RegistryNumber><NameOfSubstance>gallium phosphide</NameOfSubstance></Chemical><Chemical><RegistryNumber>22398-80-7</RegistryNumber><NameOfSubstance>indium phosphide</NameOfSubstance></Chemical><Chemical><RegistryNumber>CH46OC8YV4</RegistryNumber><NameOfSubstance>Gallium</NameOfSubstance></Chemical></ChemicalList><CitationSubset>IM</CitationSubset><MeshHeadingList><MeshHeading><DescriptorName MajorTopicYN="N">Crystallization</DescriptorName></MeshHeading><MeshHeading><DescriptorName MajorTopicYN="N">Equipment Design</DescriptorName></MeshHeading><MeshHeading><DescriptorName MajorTopicYN="N">Equipment Failure Analysis</DescriptorName></MeshHeading><MeshHeading><DescriptorName MajorTopicYN="N">Gallium</DescriptorName><QualifierName MajorTopicYN="Y">chemistry</QualifierName></MeshHeading><MeshHeading><DescriptorName MajorTopicYN="N">Indium</DescriptorName><QualifierName MajorTopicYN="Y">chemistry</QualifierName></MeshHeading><MeshHeading><DescriptorName MajorTopicYN="N">Materials Testing</DescriptorName></MeshHeading><MeshHeading><DescriptorName MajorTopicYN="N">Phosphines</DescriptorName><QualifierName MajorTopicYN="Y">chemistry</QualifierName></MeshHeading><MeshHeading><DescriptorName MajorTopicYN="N">Refractometry</DescriptorName><QualifierName MajorTopicYN="Y">instrumentation</QualifierName></MeshHeading><MeshHeading><DescriptorName MajorTopicYN="N">Signal Processing, Computer-Assisted</DescriptorName><QualifierName MajorTopicYN="Y">instrumentation</QualifierName></MeshHeading><MeshHeading><DescriptorName MajorTopicYN="N">Surface Plasmon Resonance</DescriptorName><QualifierName MajorTopicYN="Y">instrumentation</QualifierName></MeshHeading><MeshHeading><DescriptorName MajorTopicYN="N">Telecommunications</DescriptorName><QualifierName MajorTopicYN="Y">instrumentation</QualifierName></MeshHeading></MeshHeadingList></MedlineCitation><PubmedData><History><PubMedPubDate PubStatus="entrez"><Year>2011</Year><Month>4</Month><Day>1</Day><Hour>6</Hour><Minute>0</Minute></PubMedPubDate><PubMedPubDate PubStatus="pubmed"><Year>2011</Year><Month>4</Month><Day>1</Day><Hour>6</Hour><Minute>0</Minute></PubMedPubDate><PubMedPubDate PubStatus="medline"><Year>2011</Year><Month>8</Month><Day>5</Day><Hour>6</Hour><Minute>0</Minute></PubMedPubDate></History><PublicationStatus>ppublish</PublicationStatus><ArticleIdList><ArticleId IdType="pii">210883</ArticleId><ArticleId IdType="pubmed">21451632</ArticleId></ArticleIdList></PubmedData></pubmed></record>Pour manipuler ce document sous Unix (Dilib)
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